JuH > De' > 'a ghIH

nano Metrology neH dmp 'IHbe'chugh

18th dmp 'IH qaStaHvIS dongguan attend nano Metrology. nuqneH newest HablI' 'ej cham, booth Such 'ej Qum cha' maH!

poH: nov. 29th dec.2nd

ghobe' booth: 3_c_132

SoQ: guangdong Modern international Exhibition botlh


DubelmoHchugh maHvaD yu' 'ej QuQ vIvoqHa' pagh qeS inform

e-mail:overseas@cmm-nano.com